origen_std_lib 0.9.0 → 0.13.0

data/src/advantest/smt8/origen/test_methods/Empty.java

@@ -0,0 +1,12 @@
+package origen.test_methods;
+
+/** An empty test template */
+public class Empty extends Base {
+
+  /** Main run function for empty */
+  @Override
+  public void run() {
+    logTrace("Empty", "run");
+    super.run();
+  }
+}

data/src/advantest/smt8/origen/test_methods/Functional_test.java

@@ -0,0 +1,474 @@
+package origen.test_methods;
+
+import java.util.ArrayList;
+import java.util.List;
+import origen.common.Origen;
+import origen.common.OrigenHelpers;
+import xoc.dsa.DeviceSetupFactory;
+import xoc.dsa.IDeviceSetup;
+import xoc.dta.datatypes.MultiSiteBoolean;
+import xoc.dta.datatypes.MultiSiteLong;
+import xoc.dta.datatypes.MultiSiteString;
+import xoc.dta.measurement.IMeasurement;
+import xoc.dta.resultaccess.IDigInOutCaptureResults;
+import xoc.dta.resultaccess.IMeasurementResult;
+import xoc.dta.resultaccess.datatypes.BitSequence.BitOrder;
+import xoc.dta.resultaccess.datatypes.MultiSiteBitSequence;
+import xoc.dta.setupaccess.IParallelGroup;
+import xoc.dta.testdescriptor.IFunctionalTestDescriptor;
+
+/** The Function test template for all functional tests */
+public class Functional_test extends Base {
+
+  public IFunctionalTestDescriptor FUNC;
+
+  // Class variables
+
+  /** Pin to capture from */
+  private String _pin;
+
+  /** Number of vectors to capture */
+  private int _capture;
+
+  /** Number of bits per captured word */
+  private int _bitPerWord;
+
+  /** Pattern name */
+  @SuppressWarnings("unused")
+  private String _pattern;
+
+  /** Testname to override */
+  @SuppressWarnings("unused")
+  private String _testNameOverride;
+
+  /** The result of executing the primary pattern */
+  public IMeasurementResult funcResult;
+
+  private MultiSiteBitSequence _capturedData;
+
+  // Link to self
+  public Functional_test origen;
+
+  // Patching information
+  /** Do we need to activate the patched patterns? */
+  boolean activatePatchedMeas;
+
+  /** The measurement that is only used for patching */
+  public IMeasurement patchedMeas;
+
+  /** The measurement that is only used dynamic pattern switching */
+  public IMeasurement dynamicPatMeas;
+
+  public ArrayList<IMeasurementResult> dynamicMeasurementResults;
+
+  public boolean _hasDynamicMeas = false;
+
+  /** The list of patterns to patch */
+  List<String> patchList;
+
+  /** Used to select only one pattern from a list of patterns for site specific execution */
+  List<String> dynamicPatternList;
+
+  @Override
+  public void _setup() {
+    message(Origen.LOG_METHODTRACE, "Functional_test --> Setup");
+    origen = this;
+    patchList = new ArrayList<String>();
+    dynamicPatternList = new ArrayList<String>();
+    patchedMeas.setSpecificationName(measurement.getSpecificationName());
+    dynamicPatMeas.setSpecificationName(measurement.getSpecificationName());
+    pin("");
+    capture(0);
+    bitPerWord(1);
+    pattern("");
+    testName("");
+
+    measure_setup();
+  }
+
+  /**
+   * Creates/adds to a list of patched patterns Needs to be called for every pattern that has to be
+   * patched
+   *
+   * @param pat
+   * @return
+   */
+  public Functional_test addToPatchList(String pat) {
+
+    patchList.add("C402TNVMTester.patterns." + pat);
+    return this;
+  }
+
+  public Functional_test addToDynamicPatternList(String pat) {
+    dynamicPatternList.add(pat);
+    return this;
+  }
+
+  public Functional_test overlaySubroutinePerSite(
+      String subroutinePattern, MultiSiteLong decData, int size) {
+    Origen.overlaySubroutinePerSite(
+        "C402TNVMTester.patterns." + subroutinePattern, "NVM_DIN_PIN", decData, size);
+    return this;
+  }
+
+  //overload for full path pattern. Boolean not used at the moment
+  public Functional_test overlaySubroutinePerSite(String subroutinePattern,
+          MultiSiteLong decData, String pin, int size, Boolean FullPathPattern ) {
+    Origen.overlaySubroutinePerSite(subroutinePattern, pin, decData, size);
+    return this;
+  }
+
+  public Functional_test overlaySubroutineAllSites(
+      String subroutinePattern, long decData, int size) {
+    Origen.overlaySubroutineAllSites(
+        "C402TNVMTester.patterns." + subroutinePattern, "NVM_DIN_PIN", decData, size);
+    return this;
+  }
+
+  //overload for full path pattern. Boolean not used at the moment
+  public Functional_test overlaySubroutineAllSites(String subroutinePattern, long decData, String pin, int size, Boolean FullPathPattern) {
+      Origen.overlaySubroutineAllSites(subroutinePattern, pin, decData, size);
+      return this;
+  }
+
+  /**
+   * Setup the patch measurement instance Call after all patterns are added to the list The setup
+   * creates a new devicesetup with fake pattern calls to all patched patterns This make sure that
+   * they are referenced in this testmethod. Is is not possible to patch patterns that are not used
+   * in the testflow After this setupPatch() is called, the patchedMeas still needs to be activated,
+   * this happens in run()
+   *
+   * @return
+   */
+  public Functional_test setupPatch() {
+    IDeviceSetup ds = DeviceSetupFactory.createInstance();
+    ds.importSpec(measurement.getSpecificationName());
+    ds.sequentialBegin("measPatch");
+    {
+      for (String pat : patchList) {
+        ds.patternCall(pat);
+      }
+    }
+    ds.sequentialEnd();
+    patchedMeas.setSetups(ds);
+
+    // Warn run() that we need to activate the patched measurement still
+    activatePatchedMeas = true;
+
+    return this;
+  }
+
+  public Functional_test setupDynamicPatternList() {
+    IDeviceSetup ds = DeviceSetupFactory.createInstance();
+    ds.importSpec(dynamicPatMeas.getSpecificationName());
+    for (String pat : dynamicPatternList) {
+      ds.parallelBegin(pat);
+      {
+        ds.setBypassable();
+        ds.patternCall("C402TNVMTester.patterns." + pat);
+      }
+      ds.parallelEnd();
+    }
+    dynamicPatMeas.setSetups(ds);
+    _hasDynamicMeas = true;
+    return this;
+  }
+
+  // Executed the given (previously setup) pattern on all sites
+  public void executeDynamicPat(String pat) {
+    selectDynamicPat(pat);
+    dynamicPatMeas.execute();
+    dynamicMeasurementResults.add(dynamicPatMeas.preserveResult());
+  }
+
+  // Execute the given (previously setup) pattern on all sites except those where bypass is set to
+  // true
+  public void executeDynamicPat(String pat, MultiSiteBoolean bypass) {
+    selectDynamicPat(pat, bypass);
+    dynamicPatMeas.execute();
+    dynamicMeasurementResults.add(dynamicPatMeas.preserveResult());
+  }
+
+  // Executed the given (previously setup) patterns on all sites, where each site can have a
+  // different pattern
+  public void executeDynamicPat(MultiSiteString pats) {
+    selectDynamicPats(pats);
+    dynamicPatMeas.execute();
+    dynamicMeasurementResults.add(dynamicPatMeas.preserveResult());
+  }
+
+  public Functional_test selectDynamicPat(String pat, MultiSiteBoolean bypass) {
+    message(Origen.LOG_METHODTRACE, "Executing dynamic pattern: " + pat);
+    boolean patFound = false;
+    MultiSiteBoolean allSites = new MultiSiteBoolean(true);
+    List<IParallelGroup> paraGroups = dynamicPatMeas.operatingSequence().getParallelGroups();
+    for (IParallelGroup iParallelGroup : paraGroups) {
+      if (iParallelGroup.getName().equals(pat)) {
+        patFound = true;
+        iParallelGroup.setBypass(bypass);
+      } else {
+        iParallelGroup.setBypass(allSites);
+      }
+    }
+    if (!patFound) {
+      throw new Error(
+          "Dynamic pattern: " + pat + " not found!! Make sure you have it added in setup()");
+    }
+    return this;
+  }
+
+  public Functional_test selectDynamicPat(String pat) {
+    MultiSiteBoolean noSites = new MultiSiteBoolean(false);
+    selectDynamicPat(pat, noSites);
+    return this;
+  }
+
+  public Functional_test selectDynamicPats(MultiSiteString pats) {
+    //        boolean patFound = false;
+
+    List<IParallelGroup> paraGroups = dynamicPatMeas.operatingSequence().getParallelGroups();
+    for (IParallelGroup iParallelGroup : paraGroups) {
+      MultiSiteBoolean bypass = new MultiSiteBoolean(true);
+      for (int site : context.getActiveSites()) {
+        if (iParallelGroup.getName().equals(pats.get(site))) {
+          bypass.set(site, false);
+        }
+      }
+      iParallelGroup.setBypass(bypass);
+    }
+    //        if(!patFound)  {
+    //            throw new Error("Dynamic pattern: " + pat + " not found!! Make sure you have it
+    // added in setup()");
+    //        }
+    return this;
+  }
+
+  /**
+   * The functional test method can optionally capture data by supplying the number of vectors to
+   * capture
+   *
+   * @param v Number of vectors to capture
+   * @return
+   */
+  public Functional_test capture(int numVecs) {
+    _capture = numVecs;
+    return this;
+  }
+
+  /**
+   * If data capture is requested, supply the pin to capture data from
+   *
+   * @param pin Pin to capture from
+   * @return
+   */
+  public Functional_test pin(String pin) {
+    _pin = pin;
+    return this;
+  }
+
+  /**
+   * Serial capture data will be grouped into words, specify how many bits per word in the serial
+   * stream (default 1)
+   *
+   * @param bitsPerWord
+   * @return
+   */
+  public Functional_test bitPerWord(int bitsPerWord) {
+    _bitPerWord = bitsPerWord;
+    return this;
+  }
+
+  /**
+   * Override the pattern argument from the test suite
+   *
+   * @param patName
+   * @return
+   */
+  public Functional_test pattern(String patName) {
+    _pattern = patName;
+    return this;
+  }
+
+  /**
+   * Override the test name argument from the test suite, this can be useful if the main test item
+   * to be logged is a captured value and the pattern execution is to be logged separately. The
+   * override is only valid for one call to execute()
+   *
+   * @param testName
+   * @return
+   */
+  public Functional_test testName(String newTestName) {
+    _testNameOverride = newTestName;
+    return this;
+  }
+
+  /**
+   * Gets all captured data
+   *
+   * @return
+   */
+  public MultiSiteBitSequence capturedData() {
+    return _capturedData;
+  }
+
+  /**
+   * Gets a specific word from the captured data Bitorder is fixed to RIGHT_TO_LEFT
+   *
+   * @param wordNr
+   * @return
+   */
+  public MultiSiteLong capturedData(int wordNr) {
+    message(Origen.LOG_METHODTRACE, "Get captured data" + wordNr);
+    return capturedData(wordNr, BitOrder.RIGHT_TO_LEFT);
+  }
+
+  /**
+   * Gets a specific word from the captured data Bitorder has to be specified
+   *
+   * @param wordNr
+   * @param order BitOrder (eg. RIGHT_TO_LEFT)
+   * @return
+   */
+  public MultiSiteLong capturedData(int wordNr, BitOrder order) {
+    // Init the MultiSite array
+    MultiSiteLong MSL = new MultiSiteLong();
+
+    // Loop through the sites to get the data
+    for (int site : context.getActiveSites()) {
+      message(
+          Origen.LOG_METHODTRACE,
+          "Num cap words: " + _capturedData.get(site).toLongArray(_bitPerWord, order).length);
+      MSL.set(site, _capturedData.get(site).toLongArray(_bitPerWord, order)[wordNr]);
+    }
+    return MSL;
+  }
+
+  /**
+   * Gives the string representation of the binary sequence of the result data for a specific wordnr
+   * Bitorder is fixed to RIGHT_TO_LEFT
+   *
+   * @param wordNr
+   * @return
+   */
+  public MultiSiteString getBinaryWord(int wordNr) {
+    MultiSiteString MSS = new MultiSiteString();
+    for (int site : context.getActiveSites()) {
+      MSS.set(
+          site,
+          OrigenHelpers.longToPaddedBinaryString(
+              _capturedData.get(site).toLongArray(_bitPerWord, BitOrder.RIGHT_TO_LEFT)[wordNr],
+              _bitPerWord,
+              BitOrder.RIGHT_TO_LEFT,
+              false));
+    }
+    return MSS;
+  }
+
+  /**
+   * Gives the string representation of the HEX sequence of the result data for a specific wordnr
+   * Bitorder is fixed to RIGHT_TO_LEFT
+   *
+   * @param wordNr
+   * @return
+   */
+  public MultiSiteString getHexWord(int wordNr, int nrHexChars) {
+    MultiSiteString MSS = new MultiSiteString();
+    for (int site : context.getActiveSites()) {
+      MSS.set(
+          site,
+          OrigenHelpers.longToPaddedHexString(
+              _capturedData.get(site).toLongArray(_bitPerWord, BitOrder.RIGHT_TO_LEFT)[wordNr],
+              nrHexChars,
+              BitOrder.RIGHT_TO_LEFT));
+    }
+    return MSS;
+  }
+
+  /** Helper function for default bitPerWord use */
+  public MultiSiteString getHexWord(int wordNr) {
+    return getHexWord(wordNr, _bitPerWord / 4);
+  }
+
+  @Override
+  public void _preBody() {
+    dynamicMeasurementResults = new ArrayList<IMeasurementResult>();
+  }
+
+  /** Main run function for functional */
+  @SuppressWarnings("null")
+  @Override
+  public void run() {
+    IDigInOutCaptureResults digCapture = null;
+
+    logTrace("Functional_test", "run");
+    super.run();
+
+//  TODO - EP - with SMT 8.2.3 - xoc.dta.UncheckedDTAException: Pattern can only be set in setup().
+    // Check if we need to override the pattern name
+//    if (_pattern != "") {
+//      measurement.setPatternName(_pattern);
+//    }
+
+    // Check if we need to capture anything
+    // When capture is enabled, we have to disable the cyclePassFail
+    if (_capture > 0) {
+      logTrace("Functional_test", "Enabling capture on " + _pin);
+      measurement.digInOut(_pin).result().cyclePassFail().setEnabled(false);
+      measurement.digInOut(_pin).result().capture().setEnabled(true);
+    } else {
+      logTrace("Functional_test", "Disabling capture on " + _pin);
+      measurement.digInOut(_pin).result().cyclePassFail().setEnabled(true);
+      measurement.digInOut(_pin).result().capture().setEnabled(false);
+    }
+
+    // Run the measurement
+    measurement.execute();
+
+    funcResult = measurement.preserveResult();
+
+    // When captured was enabled, we need to load the captured data for later processing
+    // After this is done, the tester can be released
+    if (_capture > 0) {
+      // protect results to be not overwritten
+      digCapture = measurement.digInOut(_pin).preserveCaptureResults();
+    }
+
+    // Activate the patched measurements
+    // Without this, you cannot patch any patterns that are not used in THIS testmethod
+    if (activatePatchedMeas) {
+      patchedMeas.activate();
+    }
+
+    // Assume for now that if force pass is set then branching decision could be dependent on the
+    // result of this test, in future add another attribute to control async processing on/off
+    if (!syncPar && !forcePass) {
+      releaseTester();
+    }
+
+    if (_capture > 0) {
+      _capturedData =
+          digCapture.getSerialBitsAsBitSequence(measurement.getSignal(_pin).getDutSignalName());
+    }
+  }
+
+  @Override
+  public void processResults() {
+    logTrace("Functional_test", "processResults");
+
+    if (_hasDynamicMeas && dynamicMeasurementResults.size() > 0) {
+      MultiSiteBoolean dynamicPassed = new MultiSiteBoolean(dynamicMeasurementResults.get(0).hasPassed());
+      for (IMeasurementResult result : dynamicMeasurementResults) {
+              dynamicPassed = dynamicPassed.and(result.hasPassed());
+      }
+      if (funcResult != null) {
+        judgeAndDatalog(FUNC, dynamicPassed.and(funcResult.hasPassed()));
+      } else {
+        judgeAndDatalog(FUNC, dynamicPassed);
+      }
+    } else {
+      if (funcResult != null) {
+        judgeAndDatalog(FUNC, funcResult);
+      }
+    }
+  }
+}